e2v scientific instruments offers SDD detector upgrades for all EDS microanalysis systems

e2v scientific instruments has developed a new version of its proven SiriusSD^®Silicon Drift Detector which is directly compatible with most EDS systems, past and present, regardless of manufacturer. The product is specifically designed to replace Si(Li) detectors on existing EDS systems with the latest in SDD technology and can be fitted to all Scanning Electron Microscopes, improving performance and efficiency and reducing running costs.

The new product is supplied as a comprehensive package consisting of the detector, SEM interface, detector power supply, cables and connectors together with a full installation guide and includes everything required for a simple, trouble-free detector exchange. e2v offers a full system compatibility guarantee.

The ‘SiriusSD-U’ detector upgrade incorporates and delivers all the benefits of SDD-based EDS analysis at an affordable price. Since the existing system software is retained there is no requirement for extensive user training. The ability to run at higher count rates without compromising the resolution significantly improves sample throughput and the quality of elemental maps. Along with the performance enhancements, the SiriusSD offers a lower cost of ownership over the Si(Li) detector due to the fact that it does not require liquid Nitrogen. That means no consumables costs and considerable savings can be made on maintenance and associated health and safety measures.

e2v SDD upgrade detectors are available with active areas of 10mm² or 30mm² with resolution from 128eV and are supplied with Light Element or Be windows.

SiriusSD-U EDS upgrade products, together with installation support, are available directly from e2v or through one of its many reseller partners.

Contact e2v scientific instruments at e2vsi@e2v.com for further details.